Semiconductor device
Provided is a method capable of forming a polycrystalline silicon resistor with preferable ratio accuracy so as to design a resistor circuit with high accuracy. In the method, a length of a low concentration impurity region constituting the polycrystalline silicon resistor in a longitudinal directio...
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Main Author | |
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Format | Patent |
Language | English |
Published |
31.01.2007
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Subjects | |
Online Access | Get full text |
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