Semiconductor device

Provided is a method capable of forming a polycrystalline silicon resistor with preferable ratio accuracy so as to design a resistor circuit with high accuracy. In the method, a length of a low concentration impurity region constituting the polycrystalline silicon resistor in a longitudinal directio...

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Bibliographic Details
Main Author TSUKAMOTO AKIKO,HARADA HIROFUMI
Format Patent
LanguageEnglish
Published 31.01.2007
Subjects
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