Circuit for testing and fine tuning integrated circuit (switch control circuit)
A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in a serial manner. The contents of the flip-flop are shifted in from an input (38) leading to the first flipflop (30) in the chain. The output...
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| Main Author | |
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| Format | Patent |
| Language | English |
| Published |
27.09.2006
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| Subjects | |
| Online Access | Get full text |
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| Abstract | A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in a serial manner. The contents of the flip-flop are shifted in from an input (38) leading to the first flipflop (30) in the chain. The output of each flip-flop connects to individual transistor switch (F1, F2, ..., Fn) whereby the states of the flip-flops control the state of the switches. Circuitry (50, 52, ..., 54) for establishing a default state of the switches may be provided. |
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| AbstractList | A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in a serial manner. The contents of the flip-flop are shifted in from an input (38) leading to the first flipflop (30) in the chain. The output of each flip-flop connects to individual transistor switch (F1, F2, ..., Fn) whereby the states of the flip-flops control the state of the switches. Circuitry (50, 52, ..., 54) for establishing a default state of the switches may be provided. |
| Author | NG PHILIP S.,YE KEN KUN,SON JINSHU |
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| Notes | Application Number: CN200480023789 |
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| PublicationDateYYYYMMDD | 2006-09-27 |
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| RelatedCompanies | ATMEL CORP |
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| Snippet | A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in... |
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| SubjectTerms | BASIC ELECTRONIC CIRCUITRY ELECTRICITY INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE STATIC STORES TESTING |
| Title | Circuit for testing and fine tuning integrated circuit (switch control circuit) |
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