Circuit for testing and fine tuning integrated circuit (switch control circuit)

A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in a serial manner. The contents of the flip-flop are shifted in from an input (38) leading to the first flipflop (30) in the chain. The output...

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Bibliographic Details
Main Author NG PHILIP S.,YE KEN KUN,SON JINSHU
Format Patent
LanguageEnglish
Published 27.09.2006
Subjects
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PULSE TECHNIQUE
STATIC STORES
TESTING
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Summary:A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops (30, 32, ..., 34) chained together in a serial manner. The contents of the flip-flop are shifted in from an input (38) leading to the first flipflop (30) in the chain. The output of each flip-flop connects to individual transistor switch (F1, F2, ..., Fn) whereby the states of the flip-flops control the state of the switches. Circuitry (50, 52, ..., 54) for establishing a default state of the switches may be provided.
Bibliography:Application Number: CN200480023789