Method for non-contact testing of fixed and inaccessible connections without using a sensor plate
A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implicit-test with a known source signal,...
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Main Author | |
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Format | Patent |
Language | English |
Published |
06.09.2006
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Subjects | |
Online Access | Get full text |
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Summary: | A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implicit-test with a known source signal, and capacitively sensing a signal on a second node of the electrical device that is capacitively coupled to the node-under-implicit-test. A defect condition such as a short or open can be determined from the capacitively sensed signal. |
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Bibliography: | Application Number: CN200610008054 |