Method for non-contact testing of fixed and inaccessible connections without using a sensor plate

A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implicit-test with a known source signal,...

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Bibliographic Details
Main Author SCHNEIDER MYRON J.,PARKER KENNETH P.,JACOBSEN CHRIS R
Format Patent
LanguageEnglish
Published 06.09.2006
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implicit-test with a known source signal, and capacitively sensing a signal on a second node of the electrical device that is capacitively coupled to the node-under-implicit-test. A defect condition such as a short or open can be determined from the capacitively sensed signal.
Bibliography:Application Number: CN200610008054