Method for controlling the formation of the trailing shield gap during perpendicular head fabrication and head formed thereby

A method for controlling the formation of the trailing shield gap during perpendicular head fabrication and head formed thereby are disclosed. The in-situ trailing shield gap deposition process removes the pre-sputter process that can damage the write pole material. Further, a seed pre-layer is form...

Full description

Saved in:
Bibliographic Details
Main Author CHEN TSUNG Y.,LIU YINSHI
Format Patent
LanguageEnglish
Published 23.08.2006
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A method for controlling the formation of the trailing shield gap during perpendicular head fabrication and head formed thereby are disclosed. The in-situ trailing shield gap deposition process removes the pre-sputter process that can damage the write pole material. Further, a seed pre-layer is formed on top of the trailing shield gap to absorb any non-uniformity of the trailing shield gap and to control issues resulting from the pre-sputter process originating from the trailing shield seed deposition.
Bibliography:Application Number: CN200610005722