Vertical trench gate transistor semiconductor device and method for fabricating the same

A first region functioning as a transistor includes a drain region, a body region formed over the drain region, a source region formed over the body region and a trench formed through the body region and having a gate electrode buried therein. A source region is formed over the body region extending...

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Bibliographic Details
Main Author MIZOKUCHI SHUJI,TSUNODA KAZUAKI
Format Patent
LanguageEnglish
Published 02.08.2006
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Summary:A first region functioning as a transistor includes a drain region, a body region formed over the drain region, a source region formed over the body region and a trench formed through the body region and having a gate electrode buried therein. A source region is formed over the body region extending in a second region. The source region forming an upper edge of the trench is rounded.
Bibliography:Application Number: CN20051129535