Combined probe for integrated circuit test

The invention relates to a combination probes for testing integrated circuit, which comprises: single head probe (1) and terminal (2); the single head probe (1) includes head (13) and end tube (12) which has a spring in the cavity, the head (13) being inserted in the tube (12) inner cavity and movin...

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Bibliographic Details
Main Author CHAOYI DUAN
Format Patent
LanguageEnglish
Published 26.07.2006
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:The invention relates to a combination probes for testing integrated circuit, which comprises: single head probe (1) and terminal (2); the single head probe (1) includes head (13) and end tube (12) which has a spring in the cavity, the head (13) being inserted in the tube (12) inner cavity and moving relative to the tube (12); the upper part of the terminal (2) is hollow and a clamping part is provided in it, any end of the single head (1) being inserted into terminal (2) and its end part being clamped tightly by clamp; the other end of the single head probe (1), which is not inserted into the terminal (2), being electronic connected with the integrated circuit or circuit board for testing, correspondingly, the end (21) of the terminal (2) being employed for testing electronic connections of the testing circuit board or the integrated circuit. Compared with prior technology, the invention has the advantages of having low resistance, capacity reactance or inductive reactance.
Bibliography:Application Number: CN2006133402