Integrated optoelectronic system for measuring fluorescence or luminescence emission decay
An optoelectronic system for measuring fluorescence or luminescence emission decay, includes (a) a light source (104) being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit (102) comprising at least one circuit causing the light source to emit light pulse...
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Main Author | |
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Format | Patent |
Language | English |
Published |
28.06.2006
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Subjects | |
Online Access | Get full text |
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Summary: | An optoelectronic system for measuring fluorescence or luminescence emission decay, includes (a) a light source (104) being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit (102) comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode (108) detecting the emission; (d) a second integrated circuit comprising a detection analysis system (110) determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure (126) enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode. |
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Bibliography: | Application Number: CN200510105859 |