Integrated optoelectronic system for measuring fluorescence or luminescence emission decay

An optoelectronic system for measuring fluorescence or luminescence emission decay, includes (a) a light source (104) being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit (102) comprising at least one circuit causing the light source to emit light pulse...

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Bibliographic Details
Main Author HELBING RENE P.,GROT ANNETTE C.,PETRILLA JOHN FRANCIS,FOUQUET JULIE E.,HARDCASTLE IAN
Format Patent
LanguageEnglish
Published 28.06.2006
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An optoelectronic system for measuring fluorescence or luminescence emission decay, includes (a) a light source (104) being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit (102) comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode (108) detecting the emission; (d) a second integrated circuit comprising a detection analysis system (110) determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure (126) enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.
Bibliography:Application Number: CN200510105859