Method for forming shallow slot isolation assembly with composite type lining
The invention provides a method for forming shallow channel isolating component with combined pad, forming a liner oxidizing layer and a silicon nitride mask on the surface of a semiconductor substrate, using the etching technique to form shallow channels, in sequence depositing a silicon nitride la...
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Main Author | |
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Format | Patent |
Language | English |
Published |
14.06.2006
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Subjects | |
Online Access | Get full text |
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Summary: | The invention provides a method for forming shallow channel isolating component with combined pad, forming a liner oxidizing layer and a silicon nitride mask on the surface of a semiconductor substrate, using the etching technique to form shallow channels, in sequence depositing a silicon nitride layer and an in situ steam generated (ISSG) oxidizing layer, and finally filling a layer of oxide in the shallow channels, so as to form the shallow channel isolating component. The method can solve the problem of depression, reducing the distorting effect and thus improving the conductivity of the component. |
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Bibliography: | Application Number: CN2004189391 |