Abstract The present invention provides a MEMs-based system (and method) which includes a sensor array including at least two sensors providing a basis for ensemble averaging.
AbstractList The present invention provides a MEMs-based system (and method) which includes a sensor array including at least two sensors providing a basis for ensemble averaging.
Author ELEFTHERIOU EVANGELOS S
DANG HIEN
SHARMA ARUN
LANTZ MARK A
POZIDIS CHARALAMPOS
SRI-JAYANTHA SRI M
Author_xml – fullname: ELEFTHERIOU EVANGELOS S
– fullname: POZIDIS CHARALAMPOS
– fullname: SRI-JAYANTHA SRI M
– fullname: SHARMA ARUN
– fullname: LANTZ MARK A
– fullname: DANG HIEN
BookMark eNqNjL0OgjAYRTvo4A_v8I06MBgi7BCMCy64k1ou0KT9StrGxLeXEB_A6SQn99y92LBj7IRuPyHCkuSeLOLkehqcpwAOCzxmo5WM2vGqFwv7MiD5hpej5pE0k9XKuxQGKnpnoSbJS2QorNeBTk3dtOej2A7SBCQ_HgTd6md1TzG7DmGWCozYVY9LkWd5cS3L7I_JFyRqQf4
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID CN1763675BB
GroupedDBID EVB
ID FETCH-epo_espacenet_CN1763675BB3
IEDL.DBID EVB
IngestDate Fri Jul 19 12:11:39 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN1763675BB3
Notes Application Number: CN2005187698
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100505&DB=EPODOC&CC=CN&NR=1763675B
ParticipantIDs epo_espacenet_CN1763675BB
PublicationCentury 2000
PublicationDate 20100505
PublicationDateYYYYMMDD 2010-05-05
PublicationDate_xml – month: 05
  year: 2010
  text: 20100505
  day: 05
PublicationDecade 2010
PublicationYear 2010
RelatedCompanies IBM
RelatedCompanies_xml – name: IBM
Score 2.8757064
Snippet The present invention provides a MEMs-based system (and method) which includes a sensor array including at least two sensors providing a basis for ensemble...
SourceID epo
SourceType Open Access Repository
SubjectTerms ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
MICROSTRUCTURAL TECHNOLOGY
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PERFORMING OPERATIONS
PHYSICS
PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
REGULATING
SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
TARIFF METERING APPARATUS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
TRANSPORTING
Title System and method for sensor replication for ensemble averaging in micro-electromechanical systems (MEMS)
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100505&DB=EPODOC&locale=&CC=CN&NR=1763675B
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qfd60KtYXe5Cgh6Bt0016CEI2KUVIWrRKbyWb3dKCTUsTEfz1zm6T6kVPgQks-8hkv92Z-T6Am7aQdtx0hOkIaZmKUc7kPKFm0mgpLhl1pawKnMOI9l6tp1F7VIFpWQujeUI_NTkielSC_p7r__Xy5xLL17mV2T2foWnx2B26vlGcjhtamM3wPTcY9P0-MxhzWWREz24D_QixsbcF2wpEK5b94M1TNSnL3xtK9xB2BthWmh9B5Wtag31W6q7VYC8swt012NX5mUmGxsIHs2OYrUnGSZwKstZ_Jgg8SYbnUXys5CYgrc1olXP-LkmM36xWJCKzlMxVGp5ZSODMpar-VYtF1rzOGbkNg_Dl7gRINxiynom9H28masyicphe6xSq6SKVZ0AcjiiGdmJKnY4lWhIxgODWhNq2LejEsupQ_7OZ83_eXcBBGUp_aF9CNV99yCvcoXN-rSf3GxzBlts
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfuCbokb87INZ9GERZGzjYTFZB0Flgyga3si6lkAig7AZE_96r2VDX_SpyTW5bO1uvevd_X4AVw0urPDO5rrNhaFLRDmdscjUo1pdYsnIK2XZ4OwHZufVeBw2hgWY5L0wCif0U4EjokVFaO-p-l8vfi6xPFVbmdyyKYrm9-2B42lZdFxTxGya5zqtfs_rUY1ShwZa8OzU0I7QN3Y3YNPCgFAFSm-u7ElZ_D5Q2nuw1UddcboPha9JGUo0510rw46fpbvLsK3qM6MEhZkNJgcwXYGMkzDmZMX_TNDxJAnGozgsxTohrcQoFTP2LkiI36xiJCLTmMxkGZ6eUeDMhOz-lZtFVrjOCbn2W_7LzSGQdmtAOzo-_Wi9UCMa5K_p1o-gGM9jcQzEZujFmM3QNO2mwesCfQDOjLFpWRY3x4ZRgcqfak7-mbuEUmfgd0fdh-DpFHbztHq1cQbFdPkhzvG0TtmFWuhvUG6ZxQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=System+and+method+for+sensor+replication+for+ensemble+averaging+in+micro-electromechanical+systems+%28MEMS%29&rft.inventor=ELEFTHERIOU+EVANGELOS+S&rft.inventor=POZIDIS+CHARALAMPOS&rft.inventor=SRI-JAYANTHA+SRI+M&rft.inventor=SHARMA+ARUN&rft.inventor=LANTZ+MARK+A&rft.inventor=DANG+HIEN&rft.date=2010-05-05&rft.externalDBID=B&rft.externalDocID=CN1763675BB