Apparatus and method for automated test setup

A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core. A logic analyzer, in communication with the trace core a...

Full description

Saved in:
Bibliographic Details
Main Author WOODWARD JOEL D.,HERNANDEZ ADRIAN M.,SAMUELS MASON B.,STEWART JAMES B. III
Format Patent
LanguageEnglish
Published 22.02.2006
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

Abstract A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core. A logic analyzer, in communication with the trace core and selecting the bank of signal to be sent from the trace core to the logic analyzer.
AbstractList A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core. A logic analyzer, in communication with the trace core and selecting the bank of signal to be sent from the trace core to the logic analyzer.
Author WOODWARD JOEL D.,HERNANDEZ ADRIAN M.,SAMUELS MASON B.,STEWART JAMES B. III
Author_xml – fullname: WOODWARD JOEL D.,HERNANDEZ ADRIAN M.,SAMUELS MASON B.,STEWART JAMES B. III
BookMark eNrjYmDJy89L5WTQdSwoSCxKLCktVkjMS1HITS3JyE9RSMsvUkgsLcnPTSxJTVEoSS0uUShOLSkt4GFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8c5-hubG5mYGBo7GhFUAABKXKx8
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID CN1737600A
GroupedDBID EVB
ID FETCH-epo_espacenet_CN1737600A3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:05:01 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN1737600A3
Notes Application Number: CN200510070930
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060222&DB=EPODOC&CC=CN&NR=1737600A
ParticipantIDs epo_espacenet_CN1737600A
PublicationCentury 2000
PublicationDate 20060222
PublicationDateYYYYMMDD 2006-02-22
PublicationDate_xml – month: 02
  year: 2006
  text: 20060222
  day: 22
PublicationDecade 2000
PublicationYear 2006
RelatedCompanies AGILENT TECHNOLOGIES INC
RelatedCompanies_xml – name: AGILENT TECHNOLOGIES INC
Score 2.6420927
Snippet A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal...
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Title Apparatus and method for automated test setup
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060222&DB=EPODOC&locale=&CC=CN&NR=1737600A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LT8MwDLbGeN5ggMY7B9RbRF_b2kOFWLppQlo3oYF2m9I2EVzaiqbi7-N06-CyqyNZTqQv_uzYDsBj6snYd6RPfWn3qCu4S3niCSoFxgID3peeoxuFp1F_8u6-LnvLFnw2vTD1nNCfejgiIipBvKv6vi7-klhhXVtZPsVfKMqfx4sgNLbRsY5fjHAYjOazcMYMxgIWGdFbYA109Yf5sgf7SKIHGgujj6HuSSn-O5TxKRzMUVemzqAlsg4cs-bftQ4cTTfP3R04rOszkxKFGwyW50CROOp53VVJeJaS9RfQBLkn4ZXKkYCKlCB_VKQUqiou4GE8WrAJRQtW282uWNSY6lxCO8sz0QXiusjSTDPxLEfP34q92PJ5YnMMASUiSlxBd5eW691LN3CyTijY1LZvoa2-K3GHLlbF9_Xp_ALnj4BB
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LT8MwDLbGeIwbDNB4LgfUW0TXdmt7qBBLOw3YugkNtFuVtqng0k00FX8fp3vAZVdHspxIX_zZsR2A-9TJYtfMXOpmRpdagluUJ46gmcBYwOa9zDFVo_A47A3frZd5d16Dz00vTDUn9KcajoiIShDvsrqvl39JLL-qrSwe4i8ULR4HM8_XttGxil80v-8F04k_YRpjHgu18M3r2Kr6Q3_ag30k2LbCQvDRVz0py_8OZXACB1PUlctTqIm8CQ22-XetCUfj9XN3Ew6r-sykQOEag8UZUCSOal53WRCep2T1BTRB7kl4KRdIQEVKkD9KUghZLs-hPQhmbEjRgmi72YiFG1PNC6jni1y0gFgWsjRdT5yOqeZvxU7ccXlicAwBM0SUuITWLi1Xu5fa0BjOxqNo9By-XsPxKrlgUMO4gbr8LsUtulsZ31Un9QsWuIM0
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Apparatus+and+method+for+automated+test+setup&rft.inventor=WOODWARD+JOEL+D.%2CHERNANDEZ+ADRIAN+M.%2CSAMUELS+MASON+B.%2CSTEWART+JAMES+B.+III&rft.date=2006-02-22&rft.externalDBID=A&rft.externalDocID=CN1737600A