Apparatus and method for automated test setup

A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core. A logic analyzer, in communication with the trace core a...

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Bibliographic Details
Main Author WOODWARD JOEL D.,HERNANDEZ ADRIAN M.,SAMUELS MASON B.,STEWART JAMES B. III
Format Patent
LanguageEnglish
Published 22.02.2006
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core. A logic analyzer, in communication with the trace core and selecting the bank of signal to be sent from the trace core to the logic analyzer.
Bibliography:Application Number: CN200510070930