High-sensitive multifunction analyser based on back light scattering technology
This invention discloses a high keen multi-purpose analyzer based on after to the light scattering technology, composed with probe, the photosource part by the examination, the signal examination and the enlargement part and the demonstration partial constitutions. The examination probe, is composed...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
27.06.2012
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Subjects | |
Online Access | Get full text |
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Summary: | This invention discloses a high keen multi-purpose analyzer based on after to the light scattering technology, composed with probe, the photosource part by the examination, the signal examination and the enlargement part and the demonstration partial constitutions. The examination probe, is composed by the abundant fluid vessel and the signalling optical fiber group, a signalling optical fiber group shines the optical fiber group for the laser, another group for the examination signalling optical fiber group, two groups of optical fibers and in the same place, from probe in the foundation insertion by the angle, two groups of optical fibers distinctions coupling on the semiconductor laser photosource and the signal examination and the amplifier, forms 180 after to the light scattering analysis examination system. The signal examination and the enlargement partially uses the silicon photoelectric generator. After this invention because has used nearly 180 to the light scattering technology, may achieve to the |
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Bibliography: | Application Number: CN2005120533 |