Method for multilevel copper interconnects for ultra large scale integration

一种制造集成电路的方法,该方法利用金属氧化物薄膜(220)作为籽晶层以在集成电路中建立多层互连结构。在晶片(210)上淀积金属氧化物薄膜(220),按与金属线图形(215)对应的图形利用标准光刻以暴露金属氧化物膜(220)。该金属氧化物膜(220)转化为金属层(240),然后通过选择性CVD或者化学镀可在转化的氧化膜(260)上淀积金属膜(250)。然后以利用通孔光刻的类似工艺制造通孔(280)。继续该工艺直到制造出期望的多层结构。 A method of manufacturing integrated circuits using a thin metal oxide film as a...

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Bibliographic Details
Main Authors J.E. GEUSIC, K.Y. AHN
Format Patent
LanguageChinese
English
Published 22.09.2004
Edition7
Subjects
Online AccessGet full text

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Summary:一种制造集成电路的方法,该方法利用金属氧化物薄膜(220)作为籽晶层以在集成电路中建立多层互连结构。在晶片(210)上淀积金属氧化物薄膜(220),按与金属线图形(215)对应的图形利用标准光刻以暴露金属氧化物膜(220)。该金属氧化物膜(220)转化为金属层(240),然后通过选择性CVD或者化学镀可在转化的氧化膜(260)上淀积金属膜(250)。然后以利用通孔光刻的类似工艺制造通孔(280)。继续该工艺直到制造出期望的多层结构。 A method of manufacturing integrated circuits using a thin metal oxide film as a seed layer for building multilevel interconnects structures in integrated circuits. Thin layer metal oxide films are deposited on a wafer, and standard optical lithography is used to expose the metal oxide film in a pattern corresponding to a metal line pattern. The metal oxide film is converted to a layer of metal, and a metal film may then be deposited on the converted oxide film by either selective CVD or electroless plating. Via holes are then fabricated in a similar process using via hole lithography. The process is continued until the desired multilevel structure is fabricated.
Bibliography:Application Number: CN20028004555