Method and apparatus for leak-testing electroluminescent device
描述一种通过电致发光有机物质的光致降解程度来检查有机电致发光器件中的氧泄漏的方法。由于出现氧而导致了电致发光有机物质的光致降解，并且通过比较在用光(如激光)照射该物质前后的物质的电致发光状况被检查出来。在一密封有机电致发光器件中的因有氧而导致的光致降解证实了器件出现泄漏，泄漏导致器件寿命缩短。本发明提供了在有机电致发光器件制造后立即快速、无破坏地检查其泄漏的方法。甚至可以在线识别并抛弃泄漏的器件。 A method of leak-testing an electroluminescent device includes enclosing at least one light emittin...
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| Main Authors | , |
|---|---|
| Format | Patent |
| Language | Chinese English |
| Published |
15.09.2004
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| Edition | 7 |
| Subjects | |
| Online Access | Get full text |
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| Abstract | 描述一种通过电致发光有机物质的光致降解程度来检查有机电致发光器件中的氧泄漏的方法。由于出现氧而导致了电致发光有机物质的光致降解，并且通过比较在用光(如激光)照射该物质前后的物质的电致发光状况被检查出来。在一密封有机电致发光器件中的因有氧而导致的光致降解证实了器件出现泄漏，泄漏导致器件寿命缩短。本发明提供了在有机电致发光器件制造后立即快速、无破坏地检查其泄漏的方法。甚至可以在线识别并抛弃泄漏的器件。
A method of leak-testing an electroluminescent device includes enclosing at least one light emitting diode (LED) including LED material in a housing of the electroluminescent device such that at least a surface portion of the LED material is in contact with atmosphere within the housing, and measuring photo-oxidation of the LED material. |
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| AbstractList | 描述一种通过电致发光有机物质的光致降解程度来检查有机电致发光器件中的氧泄漏的方法。由于出现氧而导致了电致发光有机物质的光致降解，并且通过比较在用光(如激光)照射该物质前后的物质的电致发光状况被检查出来。在一密封有机电致发光器件中的因有氧而导致的光致降解证实了器件出现泄漏，泄漏导致器件寿命缩短。本发明提供了在有机电致发光器件制造后立即快速、无破坏地检查其泄漏的方法。甚至可以在线识别并抛弃泄漏的器件。
A method of leak-testing an electroluminescent device includes enclosing at least one light emitting diode (LED) including LED material in a housing of the electroluminescent device such that at least a surface portion of the LED material is in contact with atmosphere within the housing, and measuring photo-oxidation of the LED material. |
| Author | A.J.G. MANK P. VAN DER WEJJER |
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| DocumentTitleAlternate | 电致发光器件的检漏方法和仪器 |
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| Notes | Application Number: CN20028012256 |
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| RelatedCompanies | KONINKLIJKE PHILIPS ELECTRONICS N.V |
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| SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| Title | Method and apparatus for leak-testing electroluminescent device |
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