Method and apparatus for leak-testing electroluminescent device

描述一种通过电致发光有机物质的光致降解程度来检查有机电致发光器件中的氧泄漏的方法。由于出现氧而导致了电致发光有机物质的光致降解，并且通过比较在用光(如激光)照射该物质前后的物质的电致发光状况被检查出来。在一密封有机电致发光器件中的因有氧而导致的光致降解证实了器件出现泄漏，泄漏导致器件寿命缩短。本发明提供了在有机电致发光器件制造后立即快速、无破坏地检查其泄漏的方法。甚至可以在线识别并抛弃泄漏的器件。 A method of leak-testing an electroluminescent device includes enclosing at least one light emittin...

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Bibliographic Details
Main Authors P. VAN DER WEJJER, A.J.G. MANK
Format Patent
LanguageChinese
English
Published 15.09.2004
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:描述一种通过电致发光有机物质的光致降解程度来检查有机电致发光器件中的氧泄漏的方法。由于出现氧而导致了电致发光有机物质的光致降解，并且通过比较在用光(如激光)照射该物质前后的物质的电致发光状况被检查出来。在一密封有机电致发光器件中的因有氧而导致的光致降解证实了器件出现泄漏，泄漏导致器件寿命缩短。本发明提供了在有机电致发光器件制造后立即快速、无破坏地检查其泄漏的方法。甚至可以在线识别并抛弃泄漏的器件。 A method of leak-testing an electroluminescent device includes enclosing at least one light emitting diode (LED) including LED material in a housing of the electroluminescent device such that at least a surface portion of the LED material is in contact with atmosphere within the housing, and measuring photo-oxidation of the LED material.
Bibliography:Application Number: CN20028012256