Sample holder for X-ray photoelectron spectroscopy in-situ test and application thereof

• Main Authors: DUAN CHAO, GAO GANG, YANG LEI, ZHU JIAQI, QU HUAIZHI, XU LIANGGE
• Format: Patent
• Language: Chinese; English
• Published: 16.08.2024
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a sample holder for X-ray photoelectron spectroscopy in-situ testing and application thereof, and relates to the field of photoelectron spectroscopy in-situ tests.The sample holder comprises a rack and further comprises a placing table used for placing a test sample, the bottom of the placing table is fixedly connected with the rack, the top of the placing table is provided with an arc-shaped groove and an annular table, and the annular table is fixedly connected with the arc-shaped groove. The inner wall of the annular table is rotationally connected with the placing table, and the fixing mechanism is installed on the annular table; according to the sample support for the in-situ test of the X-ray photoelectron spectroscopy, while the B driving assembly drives the A support to rotate, the C driving assembly drives the B support to rotate, so that the B support drives the pressing pieces to rotate to press a test sample, and the pressing pieces surround the test sample to press the tes