Cutting device for sampling system, sampling system and control method

• Main Authors: CHEN YANGTUAN, MA SHUANG, TAN SHENGHU
• Format: Patent
• Language: Chinese; English
• Published: 16.08.2024
• Subjects: BROACHING; FILING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; LIKE OPERATIONS FOR WORKING METAL BY REMOVING MATERIAL, NOTOTHERWISE PROVIDED FOR; MACHINE TOOLS; MEASURING; METAL-WORKING NOT OTHERWISE PROVIDED FOR; PERFORMING OPERATIONS; PHYSICS; PLANING; SAWING; SCRAPING; SHEARING; SLOTTING; TESTING; TRANSPORTING

The invention discloses a cutting device for a sampling system, the sampling system and a control method, and the cutting device comprises a fixing mechanism for fixing a sample accommodating section of a sampling probe; the cutting mechanism can reciprocate along the longitudinal direction and is used for cutting a sample accommodating section from the sampling probe; and the sample taking-out mechanism is movably arranged on the placing table and is used for taking out the sample from the sample accommodating section. The cutting device for the sampling system is simple in structure, a sample can be automatically, quickly and efficiently taken out from the sampling probe, and damage to the sample can be avoided. 本申请公开了一种用于取样系统的切割装置、取样系统和控制方法，该切割装置包括：固定机构，用于固定取样探头的样本容纳段；切割机构，可沿纵向往复移动并用于从取样探头上切割出样本容纳段；样本取出机构，可移动地设置在放置台上并用于将样本从样本容纳段中取出。该用于取样系统的切割装置结构简单，能自动、快速、高效地将样本从取样探头中取出，还能避免对样本造成损坏。