CTD data quality control method and device and electronic equipment

• Main Authors: ZHANG HONGBO, YIN TIENAN, WANG JUNJIE, MA HONGYI, LI SA, ZHOU YIMING, LYU RUI, ZENG CHONGJI
• Format: Patent
• Language: Chinese; English
• Published: 26.07.2024
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

The invention provides a CTD data quality control method and device and electronic equipment. The method comprises the following steps: acquiring first observation data measured by CTD measurement equipment, and performing first quality control on the first observation data based on position information and depth information of the first observation data to obtain observation layer data; interpolating the observation layer data according to the depth of the observation layer data to obtain first standard layer data; and performing second quality control on the first standard layer data based on the depth information of the first standard layer data to obtain target data. Therefore, according to the scheme, by performing quality control on the data twice, the data can be verified and calibrated more deeply, errors are further reduced, the accuracy of the data is improved, the possibility of data errors is further reduced, and the data are more reliable. 本申请提出一种CTD数据的质量控制方法、装置及电子设备。该方法包括：获取CTD测量设备测量的第一观测数据，并基于第