Improved wavelength calibration method based on characteristic wavelength

• Main Authors: GUO CHUNFU, ZHANG CHENGHAO, LI WEIQI
• Format: Patent
• Language: Chinese; English
• Published: 16.07.2024
• Subjects: COLORIMETRY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING

The invention provides a wavelength calibration method based on characteristic wavelength improvement, which comprises the following steps: firstly, measuring a standard sample through a near-infrared spectrometer to obtain a reflected light intensity-pixel sequence number sequence; solving a pixel-wavelength model by using polynomial fitting; finding out the wavelength corresponding to the light intensity peak point position, and calculating the reciprocal of the wavelength, namely the wave number; through a nonlinear regression algorithm, iteratively calculating a corresponding relationship between the pixel sequence number and the wave number of the representative near-infrared high-resolution spectrometer; and finally, a frequency spectrum is obtained through FFT transformation, a final wavelength coefficient is determined according to the symmetry of the frequency spectrum, and wavelength calibration of the spectrometer is completed. In the prior art, a plurality of groups of standard samples and accurat