Structural parallelism measurement method and device, electronic equipment and storage medium

• Main Authors: ZHANG LITAO, HU XIAOZHEN, HAN SENYUAN, WANG QIUPING, YANG SEN, LIU XINGDONG, LI MIN, WU JIN, FAN HAIFENG, WANG LIREN, XU JIANWEI, GONG CHUNJIE, HUANG YONG, LU ZHONGYAN, LIN HENGQUAN, CHEN HANTANG
• Format: Patent
• Language: Chinese; English
• Published: 16.07.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention relates to the technical field of measurement, and provides a structure parallelism measurement method and device, electronic equipment and a storage medium, based on the measurement device, the method comprises the following steps: determining a first measurement position and a second...