Millimeter/terahertz wave emission frequency and beam quality measurement system and method

• Main Authors: GUO XUGUANG, ZHU YIMING, LIN RUFEI
• Format: Patent
• Language: Chinese; English
• Published: 09.07.2024
• Subjects: COLORIMETRY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

The invention provides a millimeter/terahertz wave emission frequency and beam quality measurement system and method. The millimeter/terahertz wave emission frequency and beam quality measurement system comprises a laser emission module, a signal generation module, a scanning module and a data acquisition module. According to the millimeter/terahertz wave emission frequency and wave beam quality measurement system and method, a detection light path adopts optical fiber transition, linkage can be realized by combining with a probe, and space scanning is realized. A heterodyne method is adopted for signal detection, and a terahertz frequency comb generated by the action of femtosecond laser and the light guide probe and continuous millimeter/terahertz waves are subjected to difference frequency to obtain an intermediate frequency signal. The repetition frequency can be locked through the variable cavity length in the femtosecond laser and the phase-locked feedback loop, and the repetition frequency can be chang