Special tool high-precision measurement method and system

• Main Authors: CAO MEICHUN, WU XUEFENG, CAI YU
• Format: Patent
• Language: Chinese; English
• Published: 25.06.2024
• Subjects: ANALOGOUS ARRANGEMENTS USING OTHER WAVES; CALCULATING; COMPUTING; COUNTING; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; ELECTRIC DIGITAL DATA PROCESSING; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES; MEASURING; PHYSICS; RADIO DIRECTION-FINDING; RADIO NAVIGATION; TESTING

The invention relates to the technical field of tool measurement, in particular to a high-precision measurement method and system for a special tool, and the method comprises the steps: collecting transmission signals and initial reflection signals corresponding to different preset positions through a phased array radar; determining target association indexes of each preset position in different preset directions; determining a target effective index corresponding to each preset position; determining a predicted value of the target spectrogram corresponding to each preset position through an STL algorithm, and taking the predicted value as an initial predicted value corresponding to each preset position; correcting the initial predicted value corresponding to each preset position; according to the target prediction values corresponding to all the preset positions, EMD decomposition denoising is carried out on all the initial reflection signals, and target reflection signals are obtained; and measuring the to-