Line loss abnormity positioning method and device

• Main Authors: LEI BINGYIN, XUE YUDONG, ZHANG YADONG, PENG CHAODE, CAI GUANGDE, SUN RONGZHI, ZHAO YUMENG, ZHAO CHONG, WANG CHENGLI, CHEN KAIXUAN, WANG ZICHI, YANG BO, WANG JINHUI
• Format: Patent
• Language: Chinese; English
• Published: 18.06.2024
• Subjects: CALCULATING; COMPUTING; COUNTING; PHYSICS

The invention relates to the technical field of line loss analysis, in particular to a line loss anomaly positioning method and device, and the method comprises the following steps: 1), collecting the power information data of each node in a line; 2) performing clustering analysis on the electric power information data of each node in the line: if the number of data in a cluster contained in a clustering result is smaller than the set number of outliers, putting the cluster into an outlier candidate set; otherwise, the LOF genetic factors of all the nodes in the cluster are calculated through an LOF algorithm, the nodes with the genetic factors larger than a preset threshold value are put into an outlier candidate set, and the obtained outlier candidate set is a line loss abnormal data set; 3) processing the line loss anomaly data calculated in the step 2) to obtain the occurrence time of the line loss anomaly; and 4) according to the line loss rate of the line, judging whether the line where each node of the