Universal withstand voltage test device

• Main Authors: BAO WEI, CHEN DEJIN, WANG XIAOLEI, ZHANG ZHIPENG, ZHANG ZHENFEI, ZHAO HAIYANG, ZHAO NAN, YANG XIANGLONG, LU PENG, ZHAO HENG, XUE HONGTAO, MA YANKE
• Format: Patent
• Language: Chinese; English
• Published: 18.06.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to the field of electrical testing, in particular to a universal withstand voltage testing device. A universal withstand voltage test device comprises a basic unit, the basic unit comprises a test cylinder used for being connected with an external power supply and a test conductor arranged in the test cylinder, the test cylinder is provided with three split-phase interfaces, and the universal withstand voltage test device further comprises a line-shaped test unit and a delta-shaped test unit, and the split-phase interface is used for connecting the line-shaped test unit or the delta-shaped test unit. The basic unit comprises a test cylinder and a test conductor; the device also comprises a line-shaped test unit and a delta-shaped test unit, so that the device can carry out a voltage withstand test on a product with buses arranged in a line-shaped manner and can also carry out a voltage withstand test on a product with buses arranged in a delta-shaped manner after different test units are