Enhancement mode transistor with robust gate and method
The invention relates to an enhancement mode transistor with a robust gate and a method. The disclosed structures include an enhancement mode high electron mobility transistor (HEMT). The HEMT includes a barrier layer having a thick portion positioned laterally between the thin portions and a gate....
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
14.06.2024
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to an enhancement mode transistor with a robust gate and a method. The disclosed structures include an enhancement mode high electron mobility transistor (HEMT). The HEMT includes a barrier layer having a thick portion positioned laterally between the thin portions and a gate. The gate includes a semiconductor layer (e.g., a P-type III-V semiconductor layer) on the thick portion of the barrier layer and having a thick portion positioned laterally between the thin portions. The gate further includes a gate conductor layer on the semiconductor layer and narrower than a thick portion of the semiconductor layer such that an end wall of the gate is stepped. A thin portion of the barrier layer proximate these end walls minimizes or eliminates charge build-up in the underlying channel layer. To block a current path around the gate, the isolation region may be located below a thin portion of the barrier layer offset from the semiconductor layer. The structure may also include alternating e-mode |
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Bibliography: | Application Number: CN202311361618 |