Voltage sag feature extraction method and system

The invention discloses a voltage sag characteristic extraction method and system. The method comprises the following steps: constructing voltage sag data into an initial track matrix; obtaining an initial symplectic geometric component according to the initial track matrix; obtaining a symplectic g...

Full description

Saved in:
Bibliographic Details
Main Authors GUO CHENG, DAI JIANBO, YANG LINGRUI, WANG LINLING
Format Patent
LanguageChinese
English
Published 07.06.2024
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Online AccessGet full text

Cover

More Information
Summary:The invention discloses a voltage sag characteristic extraction method and system. The method comprises the following steps: constructing voltage sag data into an initial track matrix; obtaining an initial symplectic geometric component according to the initial track matrix; obtaining a symplectic geometric component according to the initial symplectic geometric component; obtaining a residual component according to the symplectic geometric component; presetting an iteration termination condition, calculating a performance parameter value of the residual component and the original voltage sag data, and comparing the performance parameter value with a preset threshold value: if the performance parameter value is lower than the preset threshold value, terminating iteration, otherwise, reconstructing the residual component into a new initial track matrix, and repeating the operation until the iteration termination condition is met; and obtaining voltage sag characteristics according to the obtained final mutuall
Bibliography:Application Number: CN202410301375