In-situ observation platform, single-particle microelectrode preparation device and microelectrode preparation method

• Main Authors: ZUO ANHAO, LI ZHE, ZHOU WEI
• Format: Patent
• Language: Chinese; English
• Published: 04.06.2024
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to an in-situ observation platform, a single-particle microelectrode preparation device and a microelectrode preparation method. The in-situ observation platform provided by the embodiment of the invention comprises a base body, the base body is provided with a plurality of first positioning parts and a plurality of second positioning parts which are arranged at intervals, the first positioning parts are used for positioning probes on the base body, and the second positioning parts are used for positioning a bearing sheet containing granules on the base body. In the preparation process of the single-particle microelectrode, the substrate can be placed in a vacuum environment, and the plurality of probes and the bearing sheet bearing the particle body are fixed on the substrate through the first positioning part and the second positioning part, so that the particle body is electrically connected with the tip end of the probe by controlling the particle body to be close to the probe; there