Defect processing method and device, electronic equipment and storage medium

• Main Authors: CHEN CHENGJIN, JIANG KEYING, CAO LIHUI
• Format: Patent
• Language: Chinese; English
• Published: 17.05.2024
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

The embodiment of the invention provides a defect processing method and device, electronic equipment and a storage medium. The defect processing method comprises the steps that defect detection is conducted on a target object on the series welding machine, defect information of the target object is obtained, and the target object comprises a belt or a battery string; acquiring defect processing information associated with the target object defect information; and generating early warning information containing the defect information and the defect processing information of the target object. In the embodiment of the invention, automatic defect detection can be carried out on the belt or the battery string, so that the timeliness and the accuracy of defect detection are relatively high, and the defect information of the target object and the associated defect processing information can be automatically displayed to maintenance personnel; therefore, the requirement on the personal experience of the maintenance