Method for realizing rapid three-dimensional measurement by using scattering lens

• Main Authors: WANG YOUTAO, WANG DONG, ZHAO WENJING, JI WEIBANG, ZHAI AIPING
• Format: Patent
• Language: Chinese; English
• Published: 03.05.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention relates to the technical field of structured light rapid three-dimensional measurement and imaging, and aims to solve the problems that a target is imaged through an isotropic medium by using an imaging method of an optical lens, but the optical lens is expensive and is easy to damage in a measurement process, so that a three-dimensional measurement system needs to be readjusted and built; the invention provides a method for realizing rapid three-dimensional measurement by using a scattering lens, and the method comprises the steps: collecting stripes at the front end of a lens-free camera by using the scattering lens as a lens, and carrying out the calibration of the scattering lens and the calibration of a structured light three-dimensional measurement system. The fast three-dimensional measurement of the structured light of a moving object is realized through a frame of fringe speckle by using a Fourier transform profile measurement method, the fast three-dimensional measurement of the struct