Method for realizing rapid three-dimensional measurement by using scattering lens
The invention relates to the technical field of structured light rapid three-dimensional measurement and imaging, and aims to solve the problems that a target is imaged through an isotropic medium by using an imaging method of an optical lens, but the optical lens is expensive and is easy to damage...
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Main Authors | , , , , |
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Format | Patent |
Language | Chinese English |
Published |
03.05.2024
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to the technical field of structured light rapid three-dimensional measurement and imaging, and aims to solve the problems that a target is imaged through an isotropic medium by using an imaging method of an optical lens, but the optical lens is expensive and is easy to damage in a measurement process, so that a three-dimensional measurement system needs to be readjusted and built; the invention provides a method for realizing rapid three-dimensional measurement by using a scattering lens, and the method comprises the steps: collecting stripes at the front end of a lens-free camera by using the scattering lens as a lens, and carrying out the calibration of the scattering lens and the calibration of a structured light three-dimensional measurement system. The fast three-dimensional measurement of the structured light of a moving object is realized through a frame of fringe speckle by using a Fourier transform profile measurement method, the fast three-dimensional measurement of the struct |
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Bibliography: | Application Number: CN202410207920 |