Semiconductor detection jig and control method and test system thereof

The invention relates to the technical field of semiconductors, and relates to a semiconductor detection jig, a control method thereof and a test system. The detection jig comprises a carrier plate and a test module, wherein the carrier plate is used for bearing the test module; the test module comp...

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Bibliographic Details
Main Author HU XIANDE
Format Patent
LanguageChinese
English
Published 26.04.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention relates to the technical field of semiconductors, and relates to a semiconductor detection jig, a control method thereof and a test system. The detection jig comprises a carrier plate and a test module, wherein the carrier plate is used for bearing the test module; the test module comprises a test circuit board, a to-be-tested unit, a contact judgment circuit and a display assembly, wherein the test circuit board comprises a test circuit; the to-be-tested unit is located on one side of the test circuit board away from the carrier plate and is in contact connection with the test circuit; the contact judgment circuit is located between the test circuit board and the carrier board and used for detecting the contact state of the unit to be tested and the test circuit, and the contact state comprises normal contact and poor contact; the display assembly is located at the top of the test circuit board, and is used for displaying a first display state when the contact state is normal, and displaying a
Bibliography:Application Number: CN202211259757