Verticality measurement method and system based on multiple capacitive sensors, and medium

• Main Authors: YU KAIMING, WANG QINRUO, WANG LIN
• Format: Patent
• Language: Chinese; English
• Published: 26.04.2024
• Subjects: DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS; GRINDING; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PERFORMING OPERATIONS; PHYSICS; POLISHING; TESTING; TRANSPORTING

The invention relates to the technical field of robot perpendicularity measurement and control, in particular to a perpendicularity measurement method and system based on multiple capacitive sensors and a medium. According to the technical scheme, the perpendicularity measuring method based on the multiple capacitive sensors comprises the following steps that S101, the distances between the multiple capacitive sensors and a workpiece are obtained through measurement of the multiple capacitive sensors, and the corresponding distance value h is recorded; s102, calculating a distance difference value delta h between the adjacent capacitive sensor and the workpiece; and S103, the offset angle # imgabs0 # of each direction is obtained through calculation. According to the method, the distance data difference between the two adjacent capacitive sensors on the left and right and the front and back of the plane and the workpiece is rapidly measured, then the deviation angles in different directions are calculated acc