Non-intrusive measuring device and method for micro leakage current of control loop

The invention provides a non-intrusive measuring device and method for small leakage current of a control loop. The device comprises a sampling head, a passive low-pass filter, an operational amplifier, an active low-pass filter and an ADC sampling chip which are connected in sequence. According to...

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Bibliographic Details
Main Authors MA HUACHAO, GUO QIANG, ZHU HANCHENG, WANG SHUYANG, LI WEN, CHEN SONGSONG, LU HANXI
Format Patent
LanguageChinese
English
Published 12.04.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention provides a non-intrusive measuring device and method for small leakage current of a control loop. The device comprises a sampling head, a passive low-pass filter, an operational amplifier, an active low-pass filter and an ADC sampling chip which are connected in sequence. According to the device, the control loop does not need to be disconnected, the measurement can be realized only by winding the control loop on the high-precision and high-sensitivity sampling head, and the operation is simple, convenient and safe. 本发明提供一种控制回路微小漏电流的非介入式测量装置及方法，该装置包括依次连接的采样头、无源低通滤波器、运算放大器、有源低通滤波器和ADC采样芯片；该装置无需断开控制回路，只需将控制回路缠绕在高精度和灵敏度采样头上面即可测量，操作既简单方便又安全。
Bibliography:Application Number: CN202311808564