Cylindrical surface arrangement optical flat array diffraction spectrometer and measurement method

• Main Authors: YAN RUI, LUO JIANHUI, TANG BO, MA GE, HEI DONGWEI, WEI FULI, LIU YONGTANG, CHEN JUN, XIA JINGTAO
• Format: Patent
• Language: Chinese; English
• Published: 12.04.2024
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to a cylindrical surface arrangement optical flat array diffraction spectrometer which comprises a radiation source positioner, a cylindrical surface arrangement optical flat array diffraction structure, a signal collection system positioner, a radiation-light conversion system, an annular light collection and transmission system, a photoelectric detector array, a signal receiving and processing system, a trigger system, a beam splitter prism and a large-area imaging detector. The invention further relates to a diffraction spectrometer measuring method which comprises the processes of X-ray diffraction focusing, radiation-light conversion, visible light splitting modulation, light collection and transmission, visible light imaging and data acquisition and storage. According to the diffraction spectrometer, the optical flat is arranged in the cylindrical surface, so that the measurement capability of weak pulse signals is improved; a radiation-light conversion system with a vertical axis