Metal material microstructure multi-angle detection device and detection method thereof

• Main Authors: SHI YAN, LI ENXING, MAO YONG, LIU ZHENWEI, LI JING, WANG CUIYING
• Format: Patent
• Language: Chinese; English
• Published: 09.04.2024
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention belongs to the technical field of metal material microscopic structure observation and detection, and provides a metal material microscopic structure multi-angle detection device and a detection method thereof. According to the device and the method, a rotatable circular working table is utilized to perform multi-angle detection on the microscopic structure of the metal material, a qualified sample is placed on the rotatable circular working table, and a metallographic microscope is utilized to observe the tissue structure of the sample from different angles and perform microscopic measurement, so that the comprehensive, stable and rapid detection on the sample is realized; according to the scheme, the problems that the observation view field angle is single and the detection comprehensiveness of the microscopic structure of the metal material is influenced due to a conventional mode can be solved; and the detection efficiency of sample defect tissues can be improved. 本发明属于金属材料显微组织观察及检测技术领域，提出一种