Intelligent unattended test method for star sensor

The invention discloses an intelligent unattended test method for a star sensor. The intelligent unattended test method comprises the following steps: acquiring test data of the star sensor by an upper computer; analyzing the test data to obtain an analysis result so as to judge the fault condition...

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Bibliographic Details
Main Authors MAO XIAONAN, YIN XIAOYING, WANG NAN, WEN ZHAOLUN, YANG XIAO, ZHAN XIAOMIN, HAN CHANG
Format Patent
LanguageChinese
English
Published 09.04.2024
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Summary:The invention discloses an intelligent unattended test method for a star sensor. The intelligent unattended test method comprises the following steps: acquiring test data of the star sensor by an upper computer; analyzing the test data to obtain an analysis result so as to judge the fault condition of the star sensor; according to the analysis result, configuring the star sensor protocol; the test data and the analysis data are stored, and a report is automatically generated, human intervention is reduced, various operations in the test process can be autonomously completed through the method, and problems existing in the star sensor are rapidly positioned; the dependency on personnel participating in the test is reduced, and the labor cost is saved; meanwhile, faults of the star sensor are positioned through the CNN network, the intelligent degree is high, and the working efficiency is improved. 本发明公开了一种星敏感器智能无人值守测试方法,包括:上位机获取星敏感器的测试数据;对所述测试数据进行解析,得到解析结果,以对所述星敏感器的故障情况进行判断;根据所述解析结果,对所述星敏感器协议进行配置;存储所述测试数据和所述解析
Bibliography:Application Number: CN202311835134