PROGRAMMABLE ANALOG CALIBRATION CIRCUIT SUPPORTING ITERATIVE MEASUREMENT OF AN INPUT SIGNAL FROM A CIRCUIT BY

• Main Authors: PANDITA BUPESH, BANERJEE ANINDYA, BOCK CHRISTIAN, GROEN, ERWIN
• Format: Patent
• Language: Chinese; English
• Published: 05.04.2024
• Subjects: BASIC ELECTRONIC CIRCUITRY; CODE CONVERSION IN GENERAL; CODING; CONTROLLING; DECODING; ELECTRICITY; PHYSICS; REGULATING; SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES

Analog calibration (ACAL) circuits that support iterative measurement of an input signal from a measured circuit and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare an input reference voltage to an input circuit voltage of a circuit under measurement and to generate a digital measurement signal based on the comparison. To allow the ACAL circuit to measure the input circuit voltage more accurately, the voltage reference generation circuit is programmable and configured to generate an input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit may be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for more accurate measurement of the input circuit voltage. 公开了支持来自被测量电路的输入信号的迭代测量的模拟