Method and apparatus for significant difference analysis of near-infrared data

The invention provides a method and a device for performing significance difference analysis on near-infrared data. The method comprises the following steps: carrying out significant difference analysis on at least two groups of obtained near-infrared data to obtain a first P value for reflecting br...

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Bibliographic Details
Main Authors DENG HAO, WANG DAIFA, WANG GANG
Format Patent
LanguageChinese
English
Published 05.04.2024
Subjects
CALCULATING
COMPUTING
COUNTING
DIAGNOSIS
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEDICAL OR VETERINARY SCIENCE
PHYSICS
SURGERY
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Summary:The invention provides a method and a device for performing significance difference analysis on near-infrared data. The method comprises the following steps: carrying out significant difference analysis on at least two groups of obtained near-infrared data to obtain a first P value for reflecting brain function condition level difference represented by the two groups of near-infrared data; determining a representative first P value based on the first P value, and obtaining a second P value based on a logarithm of the representative first P value or a logarithm of a reciprocal of the representative first P value; determining the corresponding position of the second P value on the first measurement and control strip, and performing associated display on a display mark provided at the corresponding position on the brain region association graph or the detection probe arrangement association graph; wherein different display marks are presented at the positions corresponding to the numerical values on the first me
Bibliography:Application Number: CN202410252280