Complex layout analysis method and device and electronic equipment
The invention discloses a complex layout analysis method, and belongs to the technical field of layout analysis. The method comprises the steps that a question area in an image is obtained, image information of question elements of a preset type in the image is obtained, and the image information co...
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| Main Authors | , , |
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| Format | Patent |
| Language | Chinese English |
| Published |
02.04.2024
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| Subjects | |
| Online Access | Get full text |
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| Summary: | The invention discloses a complex layout analysis method, and belongs to the technical field of layout analysis. The method comprises the steps that a question area in an image is obtained, image information of question elements of a preset type in the image is obtained, and the image information comprises question number attributes used for indicating whether the corresponding question elements contain question numbers or not and space information of the corresponding question elements in the image; according to the spatial information, respectively determining question elements of a preset type included in each question region; according to the question number attributes and the spatial information, obtaining connection information of question elements of a preset type included in the question area; and according to the connection information and the image information of the corresponding question elements, determining layout information of question instances in the question area. According to the method, t |
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| Bibliography: | Application Number: CN202211166992 |