Multiphase medium thickness measurement sensor based on electrical chromatography technology

• Main Authors: ZHAO YUWEI, DONG FANPENG, LI KUN, YUE SHIHONG
• Format: Patent
• Language: Chinese; English
• Published: 02.04.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention provides a multiphase medium thickness measuring sensor based on an electrical chromatography technology, which comprises a plurality of groups of sensor short circuits connected in series, each sensor short circuit comprises three parts, namely a hollow short column with an external thread, a middle hollow short column and a hollow short column with an internal thread in sequence, the hollow short column with the internal thread and the hollow short column with the external thread are equal in length and are matched with each other in thread; an annular ECT electrode is arranged at the interface of the middle hollow short column and the hollow short column with the external thread, another annular ECT electrode is arranged at the end part of the hollow short column with the internal thread, and an ERT electrode is arranged on the side surface of the middle hollow short column; when adjacent sensor short circuits are connected in place through threads, ECT electrodes of the adjacent sensor short