Low-cost electromagnetic radiation analysis device and method

• Main Authors: CAI WENLIANG, LUO HUISHENG, RUAN PENG, WU LEI
• Format: Patent
• Language: Chinese; English
• Published: 22.03.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to the field of near-field scanning technology and electromagnetic radiation analysis, in particular to a low-cost electromagnetic radiation analysis device and method, which combines a low-cost and high-efficiency near-field scanning technology method and a corresponding EMC (Electro Magnetic Compatibility) authentication test method which is high in cost and low in efficiency, and is optimized and improved. An interference source and an interference path can be determined through a near-field probe for products which do not pass the product far-field test, then field intensity distribution is visually presented, far-field test data and near-field test data are subjected to a large amount of comparison and fitting to obtain an approximation relationship between the far-field test data and the near-field test data, and the near-field test data can be compared and fitted in the absence of an anechoic chamber. The interference source of the circuit board is quickly positioned and measured,