Verticality measuring method and device

• Main Authors: HUANG MINGJUN, DING JINWEI, ZHANG YU
• Format: Patent
• Language: Chinese; English
• Published: 22.03.2024
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention discloses a perpendicularity measuring method and device. The method is used for measuring the perpendicularity of a pitch axis and an azimuth axis of a to-be-measured rotary table, and comprises the following steps: adjusting an angle between a first autocollimator and a reflecting mirror on the to-be-measured rotary table, enabling the first autocollimator and the reflecting mirror to be subjected to auto-collimation, and enabling the mirror surface of the reflecting mirror to be perpendicular to the pitch axis of the to-be-measured rotary table; rotating the azimuth axis of the rotary table to be measured, and adjusting the angle of the optical flat, so that the first autocollimator and the optical flat are auto-collimated; the angle of the second autocollimator is adjusted, so that the second autocollimator and the optical flat are subjected to auto-collimation; when the azimuth axis is located at different positions, the pitch axis is rotated, and the measurement imaging position of the lig