Array substrate test circuit and method, array substrate and display device

The invention relates to the technical field of display, and particularly discloses an array substrate test circuit and method, an array substrate and a display device.The array substrate test circuit comprises N test sub-circuits, each test sub-circuit comprises a first switch unit and a second swi...

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Bibliographic Details
Main Authors JIANG HAIBIN, WANG TIEGANG, HAO SHUAISHUAI
Format Patent
LanguageChinese
English
Published 19.03.2024
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Summary:The invention relates to the technical field of display, and particularly discloses an array substrate test circuit and method, an array substrate and a display device.The array substrate test circuit comprises N test sub-circuits, each test sub-circuit comprises a first switch unit and a second switch unit, the first end of each first switch unit is connected with a signal line, and the second end of each first switch unit is connected with a signal line; the second end of the first switch unit is connected with the first end of the second switch unit, the second end of the second switch unit is connected with a test line, the control end of the first switch unit in the nth test sub-circuit is connected with the first end of the first switch unit in the (n + 1) th test sub-circuit, n = 1, 2, 3,..., N-1, and n = 1, 2, 3,..., N-1. The control end of the first switch unit in the Nth test sub-circuit is connected with the first end of the first switch unit of the first test sub-circuit; the second switch units i
Bibliography:Application Number: CN202410020852