Automatic testing method and device, storage medium and electronic equipment

• Main Author: CHU LINLIN
• Format: Patent
• Language: Chinese; English
• Published: 02.02.2024
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The embodiment of the invention discloses an automatic testing method and device, a storage medium and electronic equipment, and relates to the technical field of computers. In the embodiment of the specification, the test server comprises a plurality of preset test items, and different test items can perform different types of quality tests on the code data; when the test server receives the code data, sent by the research and development server, of the target application for the first link, matching at least one appropriate target test item according to the application information of the target application and the code data of the first link, so as to perform quality test on the code data of the first link according to the at least one target test item; and generating a quality test report representing the code data of the first link. 本说明书实施例公开了一种自动化测试方法、装置、存储介质及电子设备，涉及计算机技术领域。在本说明书实施例中，测试服务器包括预设的多个测试项目，不同的测试项目可以对代码数据进行不同类型的质量测试；当测试服务器接收到研发服务器发送的目标应用针对第一环节的代码数据时，根据目标应用的应用信息和第一环节的代码数据，匹配至少一个合适的目标测试项目，从而根据至少一