Electronic total dose test method based on checkerboard

• Main Authors: ZHENG HONGCHAO, ZHANG JIANPENG, WANG LIANG, HUANG SICHONG, ZHAO YUANFU, ZHOU TAO, XU LEIPEI, DONG TAO, LIU YAJIAO, LI ZHE, WANG HUANGWEI, GOU CHUNLIANG, BI XIAO
• Format: Patent
• Language: Chinese; English
• Published: 19.01.2024
• Subjects: MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

The invention relates to a checkerboard-based total electron dose test method, which can effectively measure the actual absorbed dose of a sample and realize the estimation of the total electron dose resistance of the test sample. The method specifically comprises the following steps: (1) analyzing...