Electronic total dose test method based on checkerboard

• Main Authors: ZHENG HONGCHAO, ZHANG JIANPENG, WANG LIANG, HUANG SICHONG, ZHAO YUANFU, ZHOU TAO, XU LEIPEI, DONG TAO, LIU YAJIAO, LI ZHE, WANG HUANGWEI, GOU CHUNLIANG, BI XIAO
• Format: Patent
• Language: Chinese; English
• Published: 19.01.2024
• Subjects: MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

The invention relates to a checkerboard-based total electron dose test method, which can effectively measure the actual absorbed dose of a sample and realize the estimation of the total electron dose resistance of the test sample. The method specifically comprises the following steps: (1) analyzing material components of a test sample, and selecting proper electron energy for testing; (2) calculating an LET value of an electron through electron energy, and obtaining a theoretical total fluence; (3) the uniformity of the electron beam is measured, and it is ensured that the uniformity error of the test area is smaller than 5%; (4) ensuring that the size of the sample material is smaller than 2cm * 2cm, placing the test sample and the dosage piece in a checkerboard manner, and enabling the distance between the test sample and the dosage piece to be as small as possible; (5) starting an electron irradiation test to ensure that the total electron fluence reaches a preset value; and (6) after the test is finished,