Integrated circuit and operation method and inspection method thereof

• Main Authors: HUANG HONGRU, LIN HONGMING
• Format: Patent
• Language: Chinese; English
• Published: 01.12.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INFORMATION STORAGE; PHYSICS; STATIC STORES

The invention provides an integrated circuit and an operation method and an inspection method thereof. The integrated circuit includes a one-time programmable memory, an identifier generation circuit, and a memory controller. The identifier generation circuit generates a random number and performs a debugging code encoding operation on the random number to generate an identifier with a debugging code. The memory controller writes the identifier generated by the identifier generation circuit into the one-time programmable memory. The identifier generation circuit reads the identifier from the one-time programmable memory through the memory controller, and performs a debugging code decoding operation on the identifier provided by the memory controller to determine whether an error of the identifier from the one-time programmable memory can be corrected. Writing of the identifier is failed when it is determined that the error of the identifier from the one-time programmable memory cannot be corrected. 本发明提供一种集成电