Large compact range terahertz antenna test grating lobe correction method

The invention discloses a large compact range terahertz antenna test grating lobe correction method, which comprises the following steps: carrying out first installation and site calibration, and establishing a terahertz compact range test environment; obtaining a far-field pattern # imgabs0 # of th...

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Bibliographic Details
Main Authors ZHANG QITAO, SONG WENCHAO, WANG YU, LIU LINGGE, LI WENLONG, WAN JIXIANG, MA YUFENG
Format Patent
LanguageChinese
English
Published 28.11.2023
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Summary:The invention discloses a large compact range terahertz antenna test grating lobe correction method, which comprises the following steps: carrying out first installation and site calibration, and establishing a terahertz compact range test environment; obtaining a far-field pattern # imgabs0 # of the antenna in a first state, carrying out second installation and site calibration, obtaining a far-field pattern # imgabs1 # of the antenna in a second state, and carrying out coordinate transformation; and obtaining a second state directional diagram # imgabs2 # in the first state coordinate system to obtain a directional diagram # imgabs3 # in which field coupling of the compact range is removed. According to the invention, the influence of a grid effect formed by processing the reflecting surface of the terahertz frequency band compact range on the directional diagram result of the antenna to be tested is reduced, and the precision of the terahertz compact range test antenna is improved. 本发明公开了一种大型紧缩场太赫兹天线测试栅瓣修正
Bibliography:Application Number: CN202310944638