Method and apparatus for determining objective measurement data during subjective refraction
In a method for determining objective measurement data of at least one eye (1) of a user during subjective refraction, there is the following step: detecting subjective refraction data of the at least one eye (1) in a first illumination state. In a first illumination state and a second illumination...
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Main Authors | , , , , |
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Format | Patent |
Language | Chinese English |
Published |
03.11.2023
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Subjects | |
Online Access | Get full text |
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Summary: | In a method for determining objective measurement data of at least one eye (1) of a user during subjective refraction, there is the following step: detecting subjective refraction data of the at least one eye (1) in a first illumination state. In a first illumination state and a second illumination state different from the first illumination state, pupil metric measurement data of at least one eye (1) is detected and/or determined. In the first illumination state and the second illumination state, aberration metric measurement data of the at least one eye (1) is detected, or in the first illumination state or in the second illumination state, aberration metric measurement data of the at least one eye (1) is detected, and a pupil metric measurement data of the at least one eye (1) is determined by taking into account the detected and/or determined pupil metric measurement data of the at least one eye (1). Aberration metric measurement data of the at least one eye (1) in the other of the two illumination states |
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Bibliography: | Application Number: CN202280020725 |