Abnormality detection method and device
The anomaly detection method is applied to a computing device deployed with a monitoring system, the monitoring system is used for monitoring a plurality of key performance indicators (KPI) in the computing device, and the method comprises the steps that historical feature vectors of KPI data of M d...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
20.10.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The anomaly detection method is applied to a computing device deployed with a monitoring system, the monitoring system is used for monitoring a plurality of key performance indicators (KPI) in the computing device, and the method comprises the steps that historical feature vectors of KPI data of M dimensions stored at a moment t are determined, the historical feature vectors are used for representing feature vectors of time before the moment t, and M is larger than or equal to 1; predicting the KPI vector at the moment t through a prediction model based on the historical feature vector at the moment t to obtain a predicted feature vector at the moment t; obtaining a true value of the KPI data at the moment t, and obtaining a vector of the true value; and determining whether the KPI data at the moment t is abnormal or not based on the prediction vector and the vector of the true value. According to the method, the abnormal KPI can be quickly judged in a large amount of KPI data under the condition of no manual |
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Bibliography: | Application Number: CN202310758510 |