Abnormality detection method and device

• Main Authors: PEI CHANGHUA, ZHANG HAIMING, SI HAOTIAN, LI JIANHUI
• Format: Patent
• Language: Chinese; English
• Published: 20.10.2023
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The anomaly detection method is applied to a computing device deployed with a monitoring system, the monitoring system is used for monitoring a plurality of key performance indicators (KPI) in the computing device, and the method comprises the steps that historical feature vectors of KPI data of M dimensions stored at a moment t are determined, the historical feature vectors are used for representing feature vectors of time before the moment t, and M is larger than or equal to 1; predicting the KPI vector at the moment t through a prediction model based on the historical feature vector at the moment t to obtain a predicted feature vector at the moment t; obtaining a true value of the KPI data at the moment t, and obtaining a vector of the true value; and determining whether the KPI data at the moment t is abnormal or not based on the prediction vector and the vector of the true value. According to the method, the abnormal KPI can be quickly judged in a large amount of KPI data under the condition of no manual